Industry Panel Session
Afternoon Sessions 2
Providing a New Level of Realism in the Testing and Evaluating of Advanced Radar and Electronic Warfare Systems – Elizabeth Ruetsch, Agilent Technologies
The Next Evolution of Instrumentation for Microwave Test – Jin Bains, National Instruments
Selecting the Right Technology for High Power Military Applications – NXP
Reliable High Power GaN Amplifiers for RADAR Application – Kal Shallal, RFMD
GaN and GaAs MMIC and Module Technology Supporting the Needs of Phased Array Radars – Dean White, TriQuint Semiconductor
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Events
06
Oct
Nuremberg, Germany
21
Oct
Tel Aviv, Israel
14
Dec
New Delhi, India
International journal
This EuMA Journal is interdisciplinary and application oriented, providing a platform for the microwave industry. It is published 6 times a year
