EuMC: An Analysis of Performance Degradation of a Memoryless DPD Due to Frequency Response of an Envelope Amplifier in an EER Power Amplifier
Yuuki Funahashi, Takayuki Kato, Toshihiro Tango, Atsushi Yamaoka, Keiichi Yamaguchi, Yasuhiko Tanabe
Proceedings of the 40th European Microwave Conference
An Analysis of Performance Degradation of a Memoryless DPD due to Frequency Response of an Envelope Amplifier in an EER Power Amplifier
Yuuki Funahashi, Takayuki Kato, Toshihiro Tango, Atsushi Yamaoka, Keiichi Yamaguchi, and Yasuhiko Tanabe
Corporate Research & Development Center, Toshiba Corporation 1, Komukai-toshiba-cho, Saiwai-ku, Kawasaki