Wide-Band Characterization of Ferroelectric Thin-Films: Applications to KTN-Based Microwave Agile Devices
Vincent Laur, Anthony Rousseau, Gerard Tanne, Paul Laurent, Stephanie Deputier, Maryline Guilloux-Viry, Andre Perrin, Fabrice Huret
Proceedings of the 36th European Microwave Conference
Wide-Band Characterization of Ferroelectric Thin-Films: Applications to KTN-based Microwave Agile Devices
Vincent LAUR1, Anthony ROUSSEAU2, Gérard TANNÉ1, Paul LAURENT1, Stéphanie DEPUTIER2, Maryline GUILLOUX-VIRY2, André PERRIN2, Fabrice HURET1 LEST UBO/ENSTBr, UMR CNRS 6165, 6 Av. Le Gorgeu, CS. 93837, 29238 Brest Cedex3, France Tel. +33(0