Proceedings of the 52nd European Microwave Conference 16-Term On-Wafer Calibration with Leaky Standards and Flexible Algorithm Definition Friedbert van Raay, Fabian Thome, Christian Friesicke, Roger Lozar, Sebastian Krause, Michael Mikulla, Rüdiger Quay Fraunhofer Institute for Applied Solid State Physics (IAF), Germany friedbert.van.raay-iaf.fraunhofer.de maximum in Rollet?s stability factor k,

Proceedings of the 52nd European Microwave Conference Relative Permittivity Measurements With SIW Resonant Cavities at mm-Wave Frequencies Gabriele Federico*#1 , Anouk Hubrechsen#§ , Diego Caratelli*# , A. Bart Smolders #§ * Department of Research and Development, The Antenna Company, Eindhoven, The Netherlands of Electrical Engineering, Eindhoven University of Technology, The Netherlands § Ante

Proceedings of the 52nd European Microwave Conference Evaluation of Crosstalk between Additively Manufactured Slotted Waveguides in mmWave Applications K. Lomakin# , S. Alhasson* , G. Gold # # Institute of Microwaves and Photonics, Friedrich-Alexander Univeristy Erlangen-Nuremberg, Germany * NXP Semiconductors Germany GmbH, Germany konstantin.lomakin-fau.de, saif.alhasson-nxp.com Abstract ? In

Proceedings of the 52nd European Microwave Conference Broadband Circuit Board Interconnects Based on Anisotropic Conductive Adhesives Kevin Erkelenz1 , Noah Sielck, Alexander Koelpin, Arne F. Jacob Institute of High-Frequency Technology, Hamburg University of Technology, Germany 1 k.erkelenz-tuhh.de Abstract ? Commonly, printed circuit board (PCB) interconnects are realized as plated through-hol

Proceedings of the 52nd European Microwave Conference A Compact 2-D Phased Array Fed by 4×4 Butler Matrix Without Crossover in Broadside Coupled Stripline For Sub-6GHz 5G Applications Jean Temga1, Takashi Shiba2, Noriharu Suematsu3 Research Institute of Electrical Communication, Tohoku University, Japan {1temga.jean.a1, 2takashi.shiba.e2, 3noriharu.suematsu.a3}-tohoku.ac.jp The main advantages o

Proceedings of the 52nd European Microwave Conference Broadband Antenna Radiation Pattern Measurement From Backscattering Coefficient in a Reverberation Chamber Franc¸ois Sarrazin#1 , Ariston Reis#2 , Lotfy Zeghoudi#3 , Philippe Besnier*4 , Elodie Richalot#5 # Univ Gustave Eiffel, CNRS, ESYCOM, F-77454 Marne-la-Vall´ee, France Rennes, INSA Rennes, CNRS, IETR-UMR 6164, F-35000 Rennes, France {1 f

Proceedings of the 52nd European Microwave Conference Realization of a Passive UHF RFID Sensor Platform for the Detection of Damages on a Concrete Reinforcement Djordje Gunjic#1 , Jasmin Walk#2 , Moritz Fischer#3 , Thomas Ussmueller#4 # Microelectronics and Implantable Systems Group, Department of Mechatronics, University of Innsbruck, Austria 1 Djordje.Gunjic-uibk.ac.at carried out in the labo

Proceedings of the 52nd European Microwave Conference A Comparative Study of Two Wideband 8x8 Butler Matrices for Millimeter-wave bands Mehri Borhani Kakhki, Ahmed Shehata Abdellatif, Hari Krishna Pothula, David Wessel Wireless Advanced System Competency Centre, Huawei Technologies Canada, Canada {mehri.borhani, ahmed.abdellatif2, hari.krishna.pothula, david.wessel}-huawei.com first design are r

Proceedings of the 52nd European Microwave Conference Substrate Integrated Coaxial Line based Branch Line Coupler with Broad Out of Band Rejection Idury Satya Krishna#1 , Nicol´o Delmonte*2 , Lorenzo Silvestri*3 , Maurizio Bozzi*4 , Soumava Mukherjee#5 # Department of Electrical Engineering, Indian Institute of Techhnology Jodhpur, India of Electrical, Computer and Biomedical Engineering, Univer

Proceedings of the 52nd European Microwave Conference On-Wafer Characterization and Modelling of InP Resonant Tunnelling Diodes up to 500 GHz Simone Clochiatti#, Robin Schmidt*?, Enes Mutlu#, Michael Dieudonne?, Werner Prost#, Dominique Schreurs*, Nils Weimann# # University Duisburg-Essen, Dept. of Components for High-Frequency Electronics (BHE), Germany * KU Leuven, Belgium ? Keysight Technolog