New Probing Technology Now Enables Impedance Controlled On-Wafer Probing M. Wollitzer 1), S. Thies 1), S. Schott 2) 1) Rosenberger Hochfrequenztechnik, Hauptstrasse 1, D-83413 Fridolfing, Germany M_Wollitzer-Rosenberger.de / S_Thies-Rosenberger.de 2) Karl Suss Dresden GmbH, Suss-Strasse 1, D-01561 Sacka, Germany sschott-sussdd.de ABSTRACT The development of coaxial and planar RF measurement syste

A NOVEL PROXIMITY COUPLED ACTIVE INTEGRATED ANTENNA Sasidhar Vajha*, Member, IEEE, and Prasad Shastry**, Senior Member, IEEE *MMIC Design Engineer, TLC Precision Wafer Tech Inc, 1411, W. River Road N., Minneapolis, MN 55411, USA Tel: +1(612)341-2795, Fax: +1(612)341-2799, Email: svajha-tlcprecision.com **Professor, Dept. of Electrical and Computer Engg., Bradley University, 1501, W. Bradley Ave.,

Sub-Micron CMOS Characterisation for Single Chip Wireless Applications B. Toner, V.F. Fusco, M.S. Alam and G.A. Armstrong The Department of Electrical and Electronic Engineering The Queens University of Belfast, Ashby Building, Stranmillis Road Belfast, N. Ireland, BT9 5AH Tel: (028) 90274089 Fax: (028) 90667023 E-mail: b.toner-ee.qub.ac.uk, v.fusco-ee.qub.ac.uk ABSTRACT This paper describes a mul

PROSPECT OF MICROWAVE NEGASENSORS APPLICATION FOR ECOLOGICAL MONITORING Pavlo Molchanov, Pavel Mulyar, Yulia Podobna, Victoria Checkotun Vinnytsia State Technical University, 95, Khmelnitske Shosse, Vinnytsya, 21021, Ukraine, E-mail: envrisk-vstu.vinnica.ua ABSTRACT The principles of operation of new microwave sensors on circuits with negative resistance based negasensors has been presented. Sev

SUB-HARMONIC AND RATIONAL SYNCHRONIZATION FOR PHASE-NOISE IMPROVEMENT S. Ver Hoeye, L. Gutiérrez, S. Sancho, A. Suárez, P. González Dtpo. Ingeniería de Comunicaciones. University of Cantabria, Avda. Los Castros s/n, 39005 Santander, Spain, almu-dicom.unican.es ABSTRACT In an injected oscillator, synchronization bands (or Arnold tongues) are theoretically obtained at rational ratios between the fr

SDA FULL-WAVE ANALYSIS OF BOXED MULTISTRIP LINES OF FINITE THICKNESS EMBEDDED IN A LAYERED LOSSY MEDIUM A.Deleniv*, M. Gashinova**, and I. B. Vendik** Chalmers University of Technology, Kemivägen 9, SE-412 96 Göteborg, Sweden, Phone: +4631-772 3605, Fax: +4631-164513, Email:anatoli-ep.chalmers.se ** Electrotechical University, St.Petersburg, 197376, Russia, Phone/Fax: +7(812)3460867, Email: mwlab-

THE FERRITE_DIELECTRIC INTERFACE AND ITS APPLICATIONS Ahmet Soydan Akyol and Lionel Edward Davis Department of Electrical Engineering and Electronics UMIST, PO BOX 88, Manchester-UK M60 1QD ahmet.akyol-stud.umist.ac.uk, l.davis-umist.ac.uk Tel: 0.161.200 4801 Fax: 0.161.200 8712 ABSTRACT A single ferrite/dielectric interface (incidence from ferrite side), with the bias direction transverse to the

NEW METHOD FOR COMPUTING TRANSMISSION COEFFICIENT OF INTEGRATED FERRITE COPLANAR ISOLATOR D. Vincent1, C. R. Simovski2 , B. Bayard1, G. Noyel1 1- DIOM, Devices and Instrumentation in Optics and Microwaves, Université Jean Monnet , 23 rue Paul Michelon 42023 Saint-Etienne cedex France. Tel : 00 33 4 77 48 50 18 Fax : 00 33 4 77 48 50 39 Email : vincentd-univ-st-etienne.fr 2- Physics Department, St

MODELING AND CHARACTERIZATION OF PHOTOVARACTOR FOR MICROWAVE OPTOELECTRONICS S.A. Malyshev*, A.L. Chizh# Institute of Electronics, National Academy of Sciences of Belarus 22 Logoiski trakt, 220090, Minsk, Republic of Belarus e-mail: *malyshev-inel.bas-net.by, #photon-inel.bas-net.by ABSTRACT Optical control of microwave circuits using photodiode junction capacitance variation due to optical illumi

Coupling of Solid-State and Electromagnetic Equations for Simulation of Wireless Packaged Geometries B. McGarvey*, M. Tentzeris * The Georgia Institute of Technology, School of Electrical and Computer Engineering, Atlanta, GA 30332-0250, U.S.A., bmcgarvey-ece.gatech.edu The Georgia Institute of Technology, School of Electrical and Computer Engineering, Atlanta, GA 30332-0250, U.S.A., etentze-ece.g