A monolithic integrated, on chip matched GaAs power amplifier for HIPERPLAN with a single 3.3v supply ThomasA. Bos, Urs Lott Swiss Federal Institute of Technology (ETH) Zurich Laboratory for Electromagnetic Fields and Microwave Electronics, Gloriastr. 35, CH-8092 Zurich, Switzerland Abstract For HIPERLAN a three stage monolithic integrated power amplifier was designed and realized with a single 3.

Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves A Caddemi, A Di Paola, M Sannino Dipartimento di Ingegneria Elettrica, Universita" di Palermo, Viale delle Scienze, 90128 Palermo, Italy Abstract The good performances of a set-up for the complete characterization of HEMTs up to 40 Ghz in terms of noise and scattering parameters through noise fi

Accuracy and verification of on-wafer noise parameter measurements AU Boudiaf, Andre Scavennec* University of Marne-la-Vallee, Electrical Engineering Department, Bat. M2, 2, rue de la Butte Verte, 93166 Noisy Ie Grand, FRANCE. *CNET, Bagneux Laboratory, France Telecom, 192, avoHenri Ravera, 92220 Bagneux. Abstract The accuracy problem of noise parameter characterization of active microwave devices

Measurement of the transistor noise parameters using multi-state radiometer system Wojciech Wiatr, Marek Schmidt- Szalowski Warsaw University of Technology, Nowowiejska 15/19, 00-665 Warsaw, Poland Summary A new approach to noise characterization of microwave transistors is presented. It employs a novel noise measurement instrument, the multi-state radiometer, capable of simultaneous measuring th

"1 Thru+2.5 Reflects": A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures Changhua Wan*, Bart Nauwelears*, Walter De Raedt** and Marc Van Rossum** *Departement Elektrotechniek, Katholieke Universiteit Leuven, Kardinaal Mercierlaan 94, 3001 Heverlee, Belgium Phone: 32-16-321117 Fax: 32-16-32198,6 E-mail: changhua.wan-esat.kuleuven.ac.be ..Interuniversitair Micro-

Determining the reference impedance of on-wafer TLR calibrations on lossy substrates R. Gillon*, J.-P. Raskin*, D. Vanhoenacker*, J.-P. Colinge** Universite catholique de Louvain *Laboratoire d'Hyperfrequences **Laboratoire de Microelectronique, batiment Maxwell, place du Levant, 3 B-1348 Louvainla-Neuve, Belgium Fax: +32-10-478705 This paper presents an efficient reference impedance determination

Novel bandpass filter using couplers and resistors for millimeter-wave MMIC application Nobuakl IMAI, Toshikazu IMAOKA, Yutaka IDA, and Eiichi OGAWA ATR Optical and Radio Communication Research Laboratories 2-2 Hikari-dai, Seika-cho, Sorakugun, Kyoto 619-02, Japan Tel. +81-7749-5-1561, Fax. +817749-5-1508 E-mail: imai-acr.atr.co.jp Abstract A new passive bandpass filter with a planar structure usi

Invasive varactor tuning of dielectric resonator filters LA Trinogga andAJ Fox. Faculty of Information and Engineering Systems School of Engineering Leeds Metropolitan University, The Grange, Beckett Park, Leeds, LS6 3QS United Kingdom. Tel: UK+ 113 2832600 ext. 3767 FAX: UK+ 113 - 2833182 E-mail: L.TRINOGGA-LMU.AC.UK Some practical results are presented concerning the frequency tuning of a dielec

Dual Mode Conductor Loaded Cavity Filters KawtharA. E. Atia** Zaki*, Chi Wang*, andAli *University of Maryland, Electrical Engineering Department, College Park, MD 20742 **CTA Incorporated, 6116 Executive Blvd., Suite 800, Rockville, MD 20852 Abstract A new class of dual mode filters consisting of cylindrical waveguide cavities loaded with perfect conducting cylindrical resonator are introduced. A

A novel trap mechanism in coaxial-coupled waveguide filters Mikio Tsuji, Tetsuji Yamato, Tomohiro Mizono and Hiroshi Shigesawa. Department of Electronics, Doshisha University, Tanabe, Kyoto, 61003 Japan. Tel: +81-774656358 Fax:+81-774656824 e-mail: mtsuji-mail.doshisha.ac.jp Abstract We propose here an unprecedentedly new design idea for coaxial-coupled cutoff-waveguide filters. Contrary to ordina