A new temperature noise model of HFET with special emphasis on a gate leakage current and investigation of the bias dependence of the equivalent noise sources
Reuter R., van Waasen S., Peters D., Auer U., Brockerhoff W., Tegude F.J.
A new temperature noise model of HFET with special emphasis on a gate.
leakage current'a.nd the. bias dependence nOise sources
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investig.ation of of the equivalent
R Reuter, at van Waasen, D Peters, U Auer, W Brockerhoff,
F .J .Tegude Solid-State Electronics Department, Sonderforschungsbereich SFB 254, Gerhard-Mercator University Duisburg, KommandantenstraBe 60, 47057 Duisburg, Germany Tel (+