A MICROWAVE SYSTEM FOR HIGH ACCURACY HIGH SPATIAL RESOLUTION DIELECTRIC CONSTANT UNIFORMITY MEASUREMENT
Bhimnathwala H.B., Wang M.S., Bothra S., Kristal K.W., Borrego J.M.
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MICROWAVE SYSTEM FOR HIGH ACCURACY HIGH SPATIAL RESOLUTION DIELECTRIC CONSTANT UNIFORMITY MEASUREMENT
H. B. Bhimnathwala*, M. S. Wang*, S. Bothra**, K. W. Kristal***, and J. M. Borrego* ABSTRACT This paper presents a microwave system using an aperture in a microstrip resonant probe capable of measuring dielectric constant uniformity with high accuracy and high degree of spatial resolution. Th