EuMIC: Degradation of Ka Band GaN Low-Noise Amplifier Under High Input Power Stress
Xiaodong Tong, Rong Wang, Shiyong Zhang, Jianxing Xu, Penghui Zheng, Feng-Xiang Chen
Proceedings of the 14th European Microwave Integrated Circuits Conference
Degradation of Ka band GaN Low-Noise Amplifier
under High Input Power Stress
Xiaodong Tong#*1, Rong Wang#*2, Shiyong Zhang#*3, Jianxing Xu#*4, Penghui Zheng#*5, Feng-Xiang Chen?
#
Microsystem & Terahertz Research Center, China Academy of Engineering Physics, Chengdu 610200, China.
*Institute of Electronic Engineering, C