EuMC: All-Oxide Thin Film Varactor: From Test Structure to SMD Component
D. Walk, D. Kienemund, P. Salg, L. Zeinar, A. Radetinac, P. Komissinskiy, L. Alff, Rolf Jakoby, H. Maune
Proceedings of the 49th European Microwave Conference
All-Oxide Thin Film Varactor:
From Test Structure to SMD Component
D. Walk? , D. Kienemund? , P. Salg? , L. Zeinar? , A. Radetinac? ,
P. Komissinskiy? , L. Alff? , R. Jakoby? , and H. Maune?
? Institut
? Fachgebiet
f¨ur Mikrowellentechnik und Photonik, Technische Universit¨at Darmstadt, Darmstadt, Germany
D¨unne Schichten, Materialwissenschaf