EuMC: On-Wafer Broadband Microwave Measurement of High Impedance Devices --- CPW Test Structures with Integrated Metallic Nano-Resistances
K. Daffe, F. Mubarak, V. Mascolo, H. Votsi, N.M. Ridler, G. Dambrine, I. Roch, K. Haddadi
Proceedings of the 48th European Microwave Conference
On-Wafer Broadband Microwave Measurement of
High impedance Devices - CPW Test Structures with
Integrated Metallic Nano-resistances
K. Daffe#, F. Mubarak*1, V. Mascolo*, H. Votsi??2, N. M. Ridler?3, G. Dambrine#, I. Roch# and K. Haddadi#+4
#
University Lille, CNRS, UMR 8520 - IEMN, F-59000 Lille, France
*VSL, Van Swinden Laboratorium, Delft, T