EuMC: Experimental Comparison of Integrated Transformers in a 28nm Bulk CMOS Technology
J. Rimmelspacher, S. Breun, A. Werthof, Angelika Geiselbrechtinger, Robert Weigel, Vadim Issakov
Proceedings of the 48th European Microwave Conference
Experimental Comparison of Integrated Transformers
in a 28 nm Bulk CMOS Technology
J. Rimmelspacher1,2, S. Breun1,2, A. Werthof2, A. Geiselbrechtinger2, R. Weigel1, V. Issakov2
1
Friedrich-Alexander-University Erlangen-Nuremberg (FAU), Cauerstrasse 9, 91058 Erlangen, Germany
2
Infineon Technologies, Am Campeon 1-12, 85579 Neubiberg, Germany