EuMIC: Reliability Analysis of BiCMOS SiGe:C Technology Under Aggressive Conditions for Emerging RF and mm-Wave Applications
Insaf Lahbib, Sidina Wane, Dominique Lesenechal, Aziz Doukkali, Thanh Vinh Dinh, Laurent Leyssenne, Cristian Andrei, Guy Imbert, Patrick Martin, Philippe Descamps, Guillaume Boguszewski, Damienne Bajon
Proceedings of the 12th European Microwave Integrated Circuits Conference
Reliability Analysis of BiCMOS SiGe:C Technology Under Aggressive Conditions for Emerging RF and mm-Wave Applications
Insaf Lahbib *, Sidina Wane * +, Dominique Lesénéchal * , Aziz Doukkali *, Thanh Vinh Dinh *, Laurent Leyssenne #, Cristian Andrei +, Guy Imbert +, Patrick Martin *, Philippe Descamps *, Guillaume Boguszewsk