EuMIC: Trap Investigation Under Class AB Operation in AlGaN/GaN HEMTs Based on Output-Admittance Frequency Dispersion, Pulsed and Transient Measurements
Agostino Benvegnu, Davide Bisi, Sylvain Laurent, Matteo Meneghini, Gaudenzio Meneghesso, Jean-Luc Muraro, Denis Barataud, Enrico Zanoni, Raymond Quere
Proceedings of the 10th European Microwave Integrated Circuits Conference
Trap investigation under class AB operation in AlGaN/GaN HEMTs based on Output-Admittance Frequency Dispersion, Pulsed and Transient Measurements
Agostino Benvegnù1,2, Davide Bisi2, Sylvain Laurent1, Matteo Meneghini2, Gaudenzio Meneghesso2, Jean-Luc Muraro3, Denis Barataud1, Enrico Zanoni2, Raymond Quere1.
1
C²S² departme