EuMC: WR-5.1 Band, On-Wafer Characterization at Cryogenic Temperatures
David R. Daughton, Doug McLean, Scott Yano, Matthew Bauwens, Arthur Lichtenberger, N. Scott Barker, Robert M. Weikle, Alessandro Macor, Emile de Rijk, Arndt von Bieren, Mirko Favre, Jeffrey L. Hesler, Cliff Rowland, Eric Bryerton
Proceedings of the 45th European Microwave Conference
WR-5.1 band, on-wafer characterization at cryogenic temperatures
David R. Daughton, Doug McLean, and Scott Yano
Lake Shore Cryotronics, Inc. Westerville, OH USA david.daughton-lakeshore.com
Matthew Bauwens, Arthur Lichtenberger, N. Scott Barker, and Robert M. Weikle
DMPI, Inc. Charlottesville, VA USA
Alessandro Macor, Emile de Rijk, Arndt vo