EuMC: Switching Reliability and Switching Speed of Barium Strontium Titanate (BST) BAW Devices
							Victor Lee, Seungku Lee, Seyit Ahmet Sis, Amir Mortazawi
Proceedings of the 44th European Microwave Conference
Switching Reliability and Switching Speed of Barium Strontium Titanate (BST) BAW Devices
Victor Lee, Seungku Lee, Seyit Ahmet Sis, and Amir Mortazawi
Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor, Michigan, USA viclee-umich.edu, seungku-umich.edu, siss-umich.edu, amirm-umich.edu
Abstract--Adaptive