EuMC: 3D Compact Rectenna for Anti-Counterfeiting Application
I. Kharrat, P. Xavier, T.-P. Vuong, J.-M. Duchamp, Ph. Benech, G. Eymin, Petot Tourtollet
Proceedings of the 44th European Microwave Conference
3D Compact Rectenna for Anti-Counterfeiting Application
I. Kharrat, P. Xavier, T-P. Vuong, J-M. Duchamp, Ph. Benech
Université Grenoble-Alpes, IMEP-LAHC, 3 Parvis Louis Néel, CS 50257- 38016 Grenoble, France
G. Eymin, Petot Tourtollet
Centre Technique du Papier (CTP) Domaine Universitaire, BP 251, 38044 Grenoble, France
Abstract-- In this pa