EuMC: In-situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions
L. Leyssenne, S. Wane, R. Coq Germanicus, D. Pasquet, P. Descamps, I. Lahbib, D. Lesenechal, P. Leclere
Proceedings of the 43rd European Microwave Conference
In-Situ Measurement of Dielectric Material Properties:
Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions
L. Leyssenne#, S. Wane#, R. Coq Germanicus#, D. Pasquet#, P. Descamps#, I. Lahbib#, D. Lesénéchal#, P. Leclère*
LaMIPS Laboratory / NXP Semiconductors, Esplanade Anton Philips 2, Campus Effiscience, 14905 Colom