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EuMC: A Planar Polarization-Agile Array with Shared Aperture at K/Ka-Band
Noah Sielck, Kevin Erkelenz, Alexander Koelpin, Arne F. Jacob
Proceedings of the 53rd European Microwave Conference A Planar Polarization-Agile Array with Shared Aperture at K/Ka-Band Noah Sielck, Kevin Erkelenz, Alexander Koelpin, and Arne F. Jacob Institute of High-Frequency Technology, Hamburg University of Technology, Germany noah.sielck-tuhh.de This paper presents a planar K/Ka-band dual-polarized array based on microstrip patch antennas (MPA). It con
EuMC: A Monolithically Polyjet 3-D Printed Millimeter-Wave Quasi-Planar Air-Filled Cavity-Backed Patch Antenna with Enhanced Gain
Jianqiu Qin, Jin Li, Yueguang Lu, Sicheng Chen, Kai-Dong Hong, Tao Yuan
Proceedings of the 53rd European Microwave Conference A Monolithically Polyjet 3-D Printed Millimeter-Wave Quasi-Planar Air-Filled Cavity-Backed Patch Antenna With Enhanced Gain Jianqiu Qin#$1 , Jin Li#$*2 , Yueguang Lu#$ , Sicheng Chen#$* , Kai-Dong Hong#$ , Tao Yuan#$* # Guangdong Provincial Mobile Terminal Microwave and Millimeter-Wave Antenna Engineering Research Center, College of Electroni
EuMC: High Temperature Probe for Measuring Dielectric Parameters
Baptiste Henriot, Jesse Allens Touoyem Talla, Olivier Tantot, Nicolas Delhote, Serge Verdeyme, Jaona Randrianalisoa, Thierry Duvaut, Michael Charles
Proceedings of the 53rd European Microwave Conference High temperature probe for measuring dielectric parameters Baptiste Henriot1, Jesse Allens Touoyem Talla2, Olivier Tantot1, Nicolas Delhote1, Serge Verdeyme1, Jaona Randrianalisoa2, Thierry Duvaut2, Michaël Charles3 1 2 Université de Limoges, CNRS, XLIM, UMR 7252, France ITheMM/Université de Reims Champagne-Ardenne, Campus du Moulin de la Ho
EuMC: One-Port CSRR Structure for Dielectric Characterization of Lossy Materials
Matko Martinic, Maede Chavoshi, Dominique Schreurs, Tomislav Markovic, Bart Nauwelaers
Proceedings of the 53rd European Microwave Conference One-port CSRR Structure for Dielectric Characterization of Lossy Materials Matko Martinic #, Maede Chavoshi#, Dominique Schreurs#, Tomislav Markovic*, Bart Nauwelaers# # Department of Electrical Engineering, WaveCore Division, KU Leuven, Belgium Faculty of Electrical Engineering and Computing, Department of Electronics, Microelectronics, Comp
EuMC: Low-Pass Filters in Standard Rectangular Waveguide Using 3D Printed Dielectric Inserts
T. Stander
Proceedings of the 53rd European Microwave Conference Low-Pass Filters in Standard Rectangular Waveguide Using 3D Printed Dielectric Inserts T. Stander Dept. EEC Engineering, University of Pretoria, South Africa tinus.stander-up.ac.za Abstract ? A new approach to using dielectric 3D printing in realizing low-pass filters in waveguide is demonstrated. Cascaded stepped-impedance sections are print
EuMC: Active Probe Array Structure for Assessment of mmWave Antenna Arrays
Martin Obermaier, Martin Laabs, Thomas Deckert, Dirk Plettemeier
Proceedings of the 53rd European Microwave Conference Active Probe Array Structure for Assessment of mmWave Antenna Arrays Martin Obermaier#, Martin Laabs#, Thomas Deckert*, Dirk Plettemeier# # Chair for RF and Photonics Engineering, Technical University Dresden, Germany * NI, Germany {Martin.Obermaier, Martin.Laabs, Dirk.Plettemeier}-tu-dresden.de, Thomas.Deckert-ni.com II. N EAR F IELD TO FAR
EuMC: Experimental Study of Channel Estimation and Transmit Diversity for IRS-Based MISO System
Yueheng Li, Sven Bettinga, Xueyun Long, Mohamad Basim Alabd, Lucas Giroto de Oliveira, Thomas Zwick
Proceedings of the 53rd European Microwave Conference Experimental Study of Channel Estimation and Transmit Diversity for IRS-based MISO system Yueheng Li, Sven Bettinga, Xueyun Long, Mohamad Basim Alabd, Lucas Giroto de Oliveira, Thomas Zwick Institute of Radio Frequency Engineering and Electronics (IHE), Karlsruhe Institute of Technology (KIT), Germany yueheng.li-kit.edu Abstract ? An intellig
EuMC: Influence of Dimensional and Material Parameters and Their Uncertainties on Calculable Offset Shorts
Andreas Schramm, Frauke Gellersen, Karsten Kuhlmann
Proceedings of the 53rd European Microwave Conference Influence of Dimensional and Material Parameters and their Uncertainties on Calculable Offset Shorts Andreas Schramm, Frauke Gellersen, Karsten Kuhlmann Physikalisch-Technische Bundesanstalt, Germany {andreas.schramm, frauke.gellersen, karsten.kuhlmann}-ptb.de reference plane Abstract ? We present a systematic analysis of the uncertainties i
EuMC: Evolution of High-Power Filters for Space Applications
Christoph Schwager
Proceedings of the 53rd European Microwave Conference Evolution of High-Power Filters for Space Applications Christoph Schwager Tesat-Spacecom GmbH & Co. KG, Germany christoph.schwager-tesat.de Abstract ? Passive RF components provide key functionalities in different applications of satellite payloads. Typical payloads include multiplexers for channel separation, switches for redundancy and isol
EuMC: Modeling Integrated Antennas and Unisolated High-Power Amplifiers in Infinite Scanning Arrays
Martijn de Kok, Stefania Monni, Marc van Heijningen, Alessandro Garufo, Peter de Hek, A. Bart Smolders, Ulf Johannsen
Proceedings of the 53rd European Microwave Conference Modeling Integrated Antennas and Unisolated High-Power Amplifiers in Infinite Scanning Arrays Martijn de Kok1 2 , Stefania Monni2 , Marc van Heijningen2 , Alessandro Garufo2 , Peter de Hek2 , A. Bart Smolders1 , Ulf Johannsen1 1 Electromagnetics 2 Radar Group, Eindhoven University of Technology, The Netherlands Technology Group, TNO Defense,
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