Automatic golden device selection and measurement smoothing algorithms for microwave transistor small-signal noise modeling
Andrei S. Salnikov, Igor M. Dobush, Artem A. Popov, Dmitry V. Bilevich, Aleksandr E. Goryainov, Alexey A. Kalentyev, Aleksandr A. Metel
We propose the techniques for automatic processing of measurement results in the context of golden (typical) device selection and noise figure measurement. These techniques are for golden (typical) device selection and noise figure measurement processing. Automation of measurement result processing and microwave element modeling speeds up a modeling routine and decreases the risk of possible error