Proceedings of the 17th European Microwave Integrated Circuits Conference GaAs MMIC Interferometer for Broadband Interference Suppression Paige Danielson#1 , Megan Robinson# , Gregor Lasser# , Zoya Popovi´c#2 # Dept. of Electrical, Energy, and Computer Engineering, Univ. of Colorado Boulder, USA {1 paige.danielson, 2 zoya.popovic}-colorado.edu, 3db Abstract ? This paper presents a GaAs interfe

Proceedings of the 17th European Microwave Integrated Circuits Conference A Ka-Band GaN 2x4 MMIC Switch for compact and scalable Switch Matrices Andrea Biondi#1, Francesco Scappaviva#2, Luca Cariani#3, Francesco Vitulli*4, Francesc Coromina°5 François Deborgies°6 # MEC ? Microwave Electronics for Communications, Bologna, Italy * Thales Alenia Space, Roma, Italy ° ESA ESTEC, The Netherlands {1and

Proceedings of the 17th European Microwave Integrated Circuits Conference Surface and Buffer Trap Signatures in Fe-doped AlGaN/GaN HEMT Identified by LF S-parameter TCAD Simulations Jean-Christophe Nallatamby#1, Jose Anderson Silva Dos Santos#2, P. Vigneshwara Raja*3, Mohamed Bouslama#4, Raphael Sommet#5 # XLIM Laboratory, CNRS, XLIM UMR 7252 University of Limoges, France * Department of Electri

Proceedings of the 17th European Microwave Integrated Circuits Conference Checking Rollett?s Proviso for Degenerated Devices through S-Parameter Analysis Sergio Colangeli#1 , Patrick E. Longhi# , Walter Ciccognani# , Antonio Serino# , Ernesto Limiti# # Department of Electronics Engineering, University of Roma Tor Vergata, Rome, Italy 1 colangeli-ing.uniroma2.it Abstract ? An analysis is present

Proceedings of the 17th European Microwave Integrated Circuits Conference On The Burn-in of GaN-on-Si MMIC High Power Amplifiers for SATCOM Applications R. Giofr`e1 , P. Colantonio1 , F. Giannini1 , L. Cabria2 , M. Lopez2 , R. Leblanc3 , F. Vitobello4 1 E.E.Dept. University of Roma Tor Vergata, Rome, Italy TTI Norte, PCTC C/ Albert Einstein 14, Santander, Spain 3 OMMIC, Limeil-Br´evannes, 94450

Proceedings of the 17th European Microwave Integrated Circuits Conference 150-nm GaN HEMT Degradation under Realistic Load-Line Operation Antonio Raffo #1, Valeria Vadalà*2, Gianni Bosi#3, Rocco Giofrè+4, Giorgio Vannini#5 # Department of Engineering, University of Ferrara, Ferrara, Italy Department of Physics, University of Milano-Bicocca, Milano, Italy + Department of Engineering, University o

Proceedings of the 17th European Microwave Integrated Circuits Conference Microwave Alignment and Displacement Sensors in Groove Gap Waveguide Technology Ali K. Horestani*?1 , Zahra Shaterian*?2 , Michal Mrozowski* * Department of Microwave and Antenna Engineering, Faculty of Electronics, Telecommunications, and Informatics, Gdansk University of Technology, Gdansk, Poland ? Wireless Telecommunic

Proceedings of the 17th European Microwave Integrated Circuits Conference Near-Field Millimetre Wave Vector Microscopy Buried Structure Imaging T.Auriac , J.Raoult IES, Universit´e de Montpellier, CNRS, Montpellier, France HF synth. [13.75,16.25]GHz Abstract ? Near-field vector measurement can be used to image devices or material. From optics to microwaves, this technique uses different method

Proceedings of the 17th European Microwave Integrated Circuits Conference Reconfigurable Dual-Type Sensor for Resonant and Broadband Liquid Materials Characterization Ilona Piekarz, Slawomir Gruszczynski, Krzysztof Wincza, Jakub Sorocki Microwave Research Group, AGH University of Science and Technology, Krakow, Poland {ilona.piekarz, slawomir.gruszczynski, krzysztof.wincza, jakub.sorocki}-agh.edu

Proceedings of the 17th European Microwave Integrated Circuits Conference 20 GHz LNA and 29 GHz PA on SiGe BiCMOS technology for SatCom phased array systems Matteo Fumagalli #1, Alberto Colzani #2, Alessandro Fonte#3 # R&D Department SIAE Microelettronica Cologno Monzese, Italy { matteo.fumagalli, 2alberto.colzani, 3alessandro.fonte}-siaemic.com 1 SiGe:C BiCMOS technology process and they fully