EuMC: On-Wafer High Frequency Noise Power Measurements Under Cryogenic Conditions: A New De-Embedding Approach
Sebastien Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Sylvie Lepilliet, Christophe Laporte, Jean-Philippe Fraysse, Michel Maignan
On-wafer High Frequency Noise Power Measurements under Cryogenic conditions: A New De-embedding Approach
Sébastien Delcourt1, Gilles Dambrine1, Nour Eddine Bourzgui1, Sylvie Lepilliet1, Christophe Laporte2, Jean-Philippe Fraysse3, Michel Maignan 3
IEMN, UMR CNRS 8520, Villeneuve d'Ascq, 59652, France; 2 CNES, Toulouse centre, Toulouse, 31401, France; 3 Alcatel Space, Research and technology Depart