An accurate broadband measurement of complex permittivity using microstrip lines Adam K. Jastrzebski, Andrei D. Chuprin Department of Electronics, University of Kent, Canterbury, Kent, CT2 7NT UK Phone +44 1227 823704; Fax +44 1227 456084; E-mail A.K.Jastrzebski-ukc.ac.uk Abstract- A technique for determining complex permittivity of dielectric materials using VNA measurements of microstrip lines i

Correction and Extraction Techniques for Dielectric Constant Determination Using a Ka-Band Free-Space Measurement System Nicolas Gagnon, Jafar Shaker, Pierre Berini*, Langis Roy**, Aldo Petosa Communications Research Centre Canada, 3701 Carling Ave., P.O. Box 11490, Station H Ottawa, Ontario, Canada K2H 8S2, e- mail: nicolas.gagnon-crc.ca * University of Ottawa, 161 Louis-Pasteur St., P.O. Box 450

An Accurate and Low Cost Complex Permittivity Measurement System Using a Planar Resonant Sensor E. Fratticcioli, M. Dionigi, R. Sorrentino D.I.E.I of the University of Perugia, Perugia, via G. Duranti 93, 06125 Perugia, Italy fratticcioli-diei.unipg.it, dionigi-diei.unipg.it, sorrent-unipg.it Abstract -- A microwave planar resonant sensor for the measurement of the complex permittivity in compact

A Millimeter-wave Tunable Filter Using MEMS Varactors Abbas Abbaspour-Tamijani, Laurent Dussopt and Gabriel M.Rebeiz The Radiation Laboratory, University of Michigan 3228 EECS Building, Beal Avenue, Ann Arbor, MI 48109-2122, USA Phone: 734 763-4185, Fax: 734 647-2106, E- mail: abbasa-engin.umich.edu A mm-wave tunable 3-pole filter was developed using high-Q MEMS varactors on a quartz substrate usi

Novel RF-MEMS capacitive switching structures X. Rottenberg, H. Jansen*, P. Fiorini, W. De Raedt and H. A. C. Tilmans. * IMEC v.z.w., Division MCP, Kapeldreef 75, B3001 Leuven, Belgium, xrottenb-imec.be Twente Univ., MESA+ Res. Ins., Elec. Eng. Dpt., PO Box 217, 7500 AE Enschede, Netherlands This paper reports on novel RF-MEMS capacitive switching devices implementing an electrically floating met

Low Loss Ohmic Switches For RF Frequency Applications A. Pothier*, P. Blondy*, D. Cros*, S. Verdeyme*, P Guillon*, C. Champeaux**, P. Tristant**, A. Catherinot** * IRCOM, ** SPCTS, FACULTÉ DES SCIENCES, 123 AV. A. THOMAS 87060 LIMOGES ­ FRANCE Arnaud.pothier-ircom.unilim.fr ­ pblondy-ircom.unilim.fr This paper focuses on the design of DC contact series switch built with MEMS technology. It uses a

Tunable interdigital coplanar filters using MEMS capacitors P. Blondy*, A. Pothier*, E. Fourn**, C. Champeaux***, P. Tristant***, A. Catherinot***, G.Tanné**, E. Rius**, C. Person**, F. Huret** *I.R.C.O.M.- UMR CNRS N°6615 ­ 87060 LIMOGES CEDEX - FRANCE - TEL : 33 555 457 731 **L.E.S.T.- FRE CNRS n°2269 ­ BP 809 ­ 29285 BREST CEDEX - FRANCE -TEL : 33 298 016 938 ***S.P.C.T.S. ­ UMR CNRS N°6638 ­ 8

A New Type of Low Pass Filter With Defected Ground Structure Jong-Sik Lim, Chul-Soo Kim*, Young-Taek Lee, Dal Ahn**, and Sangwook Nam School of Electrical Engineering and Computer Science, Seoul National Univ., Seoul, Rep. Of Korea * Telecomm. Basic Research Lab., Electronics and Telecomm. Research Institute, Daejeon, Rep. Of Korea ** Division of Information Technology Engineering, SoonChunHyang U

On-Chip Microwave Filters on Standard Silicon Substrate Incorporating a Low-k BCB Dielectric Layer Lydia L. W. Leung, Kevin J. Chen, Xiao Huo and Philip C. H. Chan Department of Electrical and Electronic Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong. eelydia-ee.ust.hk, Tel.: +852-2358-7082, Fax: +852-2358-1485 Abstract - A low-loss, low -pass microstrip t

European Microwave Week 2002 - 32nd European Microwave Conference Conference Session: M2 - "New technologies and Materials for Microwave components I 1 Nonlinear Signal Processing by means of Surface Magnetostatic Waves: Solitons in Metallized Structures. T. Koike(1), R. Marcelli(2), Y. Filimonov(3), S.A. Nikitov(4), and G. Bartolucci(5) Dept. of Electronic Engineering, Tamagawa University, Mach