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SPACE­SELECTIVE EXTRACTION OF Q-FACTORS FROM FDTD SIMULATIONS Malgorzata Celuch-Marcysiak, Maciej Sypniewski, Wojciech K.Gwarek Institute of Radioelectronics, Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland tel.: +48 22 6607631 fax: +48 22 672 82 13 e-mail: m.celuch-ire.pw.edu.pl ABSTRACT A direct technique of Q-factor extraction based on space-selective integration

Electromagnetic Compatibility Analysis of Multilayer PCBs Using a Hybrid Finite Difference Time Domain (FDTD) - Partial Element Equivalent Circuit (PEEC) Method M.J.Cryan, I.J.Craddock, R.V.Penty, C.J.Railton and I.H.White Centre for Communications Research Department of Electronic and Electrical Engineering University of Bristol, Bristol, BS8 1TR, UK Tel : (+44) (0)117 928 8206, Fax : (+44) (0)11

Time-Domain Analysis of RF Structures by Means of TLM and System Identification Methods F. Coccetti, V. Chtchekatourov, P. Russer Institut für Hochfrequenztechnik, Technische Universität München Arcisstrasse 21, D-80333 Munich, Germany, e-mail: coccetti-hft.ei.tum.de Abstract - Distributed microwave circuits are analyzed in time domain using the Transmission Line Matrix (TLM) method. Prony's mode

FDFD ANALYSIS OF WHISPERING GALLERY MODES ´ Andrzej Cwikla, Michal Mrozowski Technical University of Gda´ sk, Department of Electronics, Telecommunications and Informatics, n ul. Narutowicza 11/12, 80­952, Gda´ sk, Poland n e-mails: ancwik-task.gda.pl, mim-pg.gda.pl ABSTRACT The analysis of whispering gallery modes in a cylindrical sapphire resonator is shown. The formulation involves only two co

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3D EM Characterization of Wafer Probes Hanyi Ding, Randy Wolf and John Ferrario IBM Microelectronics 1000 River St., Essex Junction, VT 05452, USA hanyi-us.ibm.com, rwolf-us.ibm.com, jferrari-us.ibm.com ABSTRACT The following paper describes a method to characterize wafer probes using a 3D EM simulator. Rather than following the traditional method of building a custom test fixture for different pr

Integrated Active Antenna Noise Figure Characterization Using a Cryogenic Anechoic Noise Source J.G. Bij de Vaate, D. Geskus, R.H. Witvers, ASTRON Netherlands Foundation for Research in Astronomy P.O. Box 2, 7990 AA Dwingeloo, The Netherlands Phone: +31-521-595100 Fax: +31-521-597332 E-mail: vaate-astron.nl 1. ABSTRACT For the phased array concept of the next generation radio telescopes, the Squa

Full Four-port Modeling and Characterization of On-chip Spiral Transformers for RFICs Telesphor Kamgaing*1,2, Kawthar Zaki2, Thomas Myers1, Michael Petras1, Mel Miller1 1- Motorola SPS, Digital DNA Laboratories, 2100 E. Elliot Road EL740, Tempe, AZ 85284, USA * Phone: (480) 413-8489, Fax: (480) 413-7918, E-mail: t.kamgaing-motorola.com 2- University of Maryland, ECE Department, College Park, MD 20

EXTRACTING THE MODEL PARAMETRS OF FERROELECTRIC THIN FILM FROM THE EXPERIMENTAL CHARACTERISTICS OF THE CAPACITANCE OF A PLANAR CAPACITOR P. Yudin, M. Nikol'ski, O. Vendik, S. Zubko, I. Vendik Electrotechnical University, St. Petersburg, 197376, Russia, Phone/Fax: +7 (812) 3460867, E-mail: mwlab-eltech.ru. ABSTRACT A procedure of extracting model parametrs of a ferroelectric thin film from the exp