The determination of the transistor dynamic I-V characteristic from large signal RF measurements
Demmler M., Tasker P.J., Leckey J.G., Schlechtweg M.
The determination of the transistor dynamic 1- V characteristic from large signal RF measurements
M Demmle.,*, P .I Taske,*, Leckey**, M Schlechtw_g* .lG
*Fraunhofer-Institut fOrAngewandte Festkorperphysik, TuliastraBe, 72,D-791 08 Freiburg, Germany Phone: +49-761-5159-576, Fax: +49-7615159-565 E-mail: md-iaf.fhg.de **High Frequency Electronics Laboratory, The Queen's University of Belfast, Asby