A new algorithm for the modal analysis of 3-D arbitrarily shaped resonant cavities P. Arcioni, M. Bresson, L. Perregrini Dept. of Electronics, Universityof Pavia Via Abbiategrasso 209,27100 Pavia, Italy. Abstract A new algorithm, constituting a modified version of the Boundary Element Method (BEM), is used to find the resonant frequencies and the modal fields of arbitrarily shaped cavity resonato

Characterisation of TEM and non-TEM planar transmission lines with a full-wave 3D field analysis technique. Jeannick Sercu (NFWO), Niels Fache and Daniel De Zutter (NFWO) laboratory of Electromagnetismand Acoustics (lEA)Universityof Ghent, Sint-Pietersnieuwstraat,41 9000 Ghent, Belgium tel 00-32-9-2643316, fax 00-32-9-2643593 1 . Abstract A full-wave 3D method of moment analysis technique is used

TIlE STUDY E-PLANE OF LASER CONTROLLED SEMICONDUcroR-LOADED WAVEGUIDE SWITCH ** Lee X In-an, . Xu n uc-8Ing. . * 111... . nu K e-qin *, . . Song L Ie-pt1, 111...Iang-Ylng * * nu X . Shanghai, 201800, Jiao Tong China. Shanghai University of Science * TEL:+86-21-9532932; FAX:+86-21-9529932; Research University, and Technology, China. ** Institute of Shanghai,200052, Optical Fiber Tec

Dynamic enhancement of semiconductor present of coherent feedback Tsang-Der Ni, Xiangdong Afshin 5 Daryoush Centerfor Microwave/Lightwave lasers in the Zhang, and Engineering, E.C.E. Department, Drexel University, Philadelphia, PA 19104, USA Tel (215) 895-2914, Fax (215) 497-9505 Abstract A harmonic conversion approach is presented for the enhancement of the dynamic of semiconductor laser. By

A new high-eHiciency procedure Tibor Berceli* I Peter R. HerczfeldO° I and Arthur Paolellao optical-microwave mixing * Technical University of Budapest, Research Institute for Telecomm. 1111 Budapest, Goldmann Gyorgyter 3, Hungary Telephone: 136)-1-115-2247, Fax: 1361-1-135-5560 0 Visiting professor at Technical University of Budapest 0 Drexel University,ECE Dept., Philadelphia, PA 19104, USA

Photoparametric amplifier/converter . . communication systems A. Khanifar, V. Anand, A. E. Parkert Deportment of Electronic and Electrical Engineering, University College London, Torrington Place, London, WC 1E 7JE, UK. tElectronics Deportment, Macquorie University, Sydney 2109, in lightwave Australia. Abstract The development of a low noise receiver using the photoparametric effect is discusse

Noise performance Eiji Suematsu Hiroyo Ogawa ** of MMIC HBTs as photodetectors *I *ATROptical and Radio Communications Research Laboratories, 22 Hikaridai, Seika-cho, Sorakugun, Kyoto 619-02, Japan TEL: +81-7749-5-1545; FAX +81-7749-5-1508; e-mail: suematsu-atrrd.atr.co ip **NTT Radio Communication Systems Laboratories, 1-2356, Toke, Yokosuka-Shi Kanagawa, 238-03, Japan TEL +81-468-59-8576; FAX

Reflectometer for small reflection coeHicient measurements in millimeter and centimeter wave bands v N Apletalin, 0 A Dyakonova, Yu N Kazantsev, D E Simonyan, V 5 Solosin, A 5 Zubov* * Institute Fryazino, of Radio Engineering & Electronics 1, Vvedenskogo sq. Moscow reg. 141120 Russia. TEL: (7095)5269266, FAX 17095)2038414 Abstract The new technique for measurements of complex reflection coefficie

On-wafer single contact S-parameter measurements to 75 GHz: Calibration procedure and measurement system P J. Tasker, M. Schlechtweg and J. Braunstein Fraunhofer W-7800 Institut fur Angewandte Freiburg, Germany. Festkorperphysik, Tullastra0e 72, Tel. (0761) 5159 561 Fax. 107611 5159 400 Abstract A measurement system based on coaxial wafer probes has been developed that allows, for the first

A novel 250 MHz - 26.5 GHz reflection analyzer C.M. Potter, G. Hiipieris, and N.J. Fanthom Marconi Instruments Ltd, Stevenage, Herts, England Abstract A novel instrument is presented which can measure vector reflection coefficient in the frequency domain, and compute the time domain response. The instrument employs the six-port technique, and its hardware implementation is described. Measureme