Home » Knowledge Centre

Knowledge Centre

Find a document written by the best international scientists in our secure database.

24787 documents
A millimeter dual six-port network analyzer in the W frequency band (75 -110 GHz)
S. Abou Chahine, B. Huyart, E. Bergeault, L. Jallet
A millimeter dual six-port network analyzer frequency band (75 -110 GHz) s. Abou Chahine, B. Huyart, E. Bergeault, L. Jallet Telecom 46, RueBarrault,75634 Paris, 33 145 817676. Paris in the W France.Telephone: Fax 33 1 45 890020 Abstract This paper presents a dual six-port network analyzer in the W frequency band (75-110 GHz). Schottky diodes operating in AC detection mode are used as power de
A novel reflectometer using a wideband monolithic active unilateral 4-port junction
I.D. Robertson, A.H. Aghvami
A novel reflectometer using a wideband active unilateral 4-port iunction I.D. Robertson and A.H. Aghvami Communications Research Group Department of Electronic and Electrical Engineering King's College London, Strand, London WC2R 2LS monolithic Tel +4471 8732523, FAX+448364781 Abstract The concept of using an active unilateral circuit to separate incident and reflected signals for the measuremen
Effective time domain analysis of periodic structures
M. Celuch-Marcysiak, W.K. Gwarek
EHective time domain analysis of periodic structures M. Celuch-Marcysiak*, W.K. GwarekU * Institute 00-665 of Radioelectronics, Worsaw University of Technology, Worszawa, Nowowieiska 15/19, POlAND; tel./fax: e-mail +48 22 255248; czorekm-ire.pw.edu.pl * * Franco-Polish School of New Information and Communication Technologies, Poznan, Mansfelda 4, POlAND; e-mail: gwarek-efp.poz.edu.pl Abstrac
Absorbing boundaries for 3D-TLM modelling of microstrip patch antennas
C. Eswarappa, W.J.R. Hoefer
Absorbing boundaries for 3D- TLMmodelling of microstrip patch antennas Channabasappa Eswarappa and WolfgangJ.R. Hoefer NSERC/MPR Teltech Research Chair in RFEngineering, Department of Electricaland Computer Engineering, Universityof Victoria, Victoria, B.C. V8W 3P6 Canada Abstract In this paper, a time domain 3D-TLM algorithm has been applied to analyze a microstrip patch antenna. A proper treatm
A generalized method for the calculation of TLM dispersion relations
M. Krumpholz, P. Russer
A generalized method for the calculation of dispersion relations M. Krumpholz: and P. Russer Ferdinand-Braun-Institut fur Hochstfrequenztechnik Rudower Chaussee 5,12489 Berlin, Germany Phone +49 (30) 6392-2625, Fox +49 (30) 6392-2612 TLM Abstract A generalized algebraic method for the calculation of TLM dispersion relations is presented. The method can be applied to general TLM nodes described b
Calculation of scattering parameters of ferrite-loaded waveguides using the FDTD method
L.A. Vielva, J.A. Pereda, A. Vegas, A. Prieto
Calculation of scattering parameters of ferrite-loaded waveguides using the FDTD method L.A.Vielva, J.A. Pereda, A. Vegas, A. Prieto Departamento de Electr6nica, Universidad de Cantabria. Avda. LosCastros sin, 39005 Santander, Cantabria, Espana Tel: +3442 201396, Fax + 3442 201402, e-mail luis-elmhp4.unican.es Abstract An extension of the FDTD method to include magnetized ferrites is applied to t
FDTD analysis of narrow pulse distortion on open and shielded coplanar waveguides
H. Shigesawa, M. Tsuji
of narrow pulse distortion on open and shielded coplanar waveguides Hiroshi Shigesawa, A50370 -JPNKUDPC FDTD analysis Mikio Tsuji. Tel. +81 75 251 3780; Fox +81 75 251 3780; e-mail * Deportment of Electronics, Doshisha University, Kyoto 602, Japan Abstract We report here a new feature of the wave-form distortion when a narrow pulse is transmitted on printed-circuit lines, which may be either
Application of system identification technique to FDTD and FDTD Diakoptics method
T.-W. Huang, B. Houshmand, T. Itoh
Application of system identification and FDTD Diakoptics method Tian-Wei Huang, Bijan Houshmand, Tatsuo Itoh and technique to FDTD Deportment of Electrical Engineering, University of California at Los Angeles 405 Hilgord Avenue, LosAngeles, CA 90024, U.S.A Abstract The system identification technique is applied to the FDTD Diakoptics method. The computational time and computer storage are sign
The microwave measurement of surface roughness
Z. Ding, J. Huang
The microwave Zhan Ding* and Jiadong Huang* * Yangzhou,225001, PR China measurement of surface roughness * Dept. of Electronic Engineering, Yngzhou Instituteof Technology, * * Microwave Division, Electronic InstrumentInstitute, P.O. Box 204, Yangzhou,225001, PR China, Fax 86-514-232229 Abstract A new principle of microwave measurement of surface roughness has been developed, The new method is
Proposed microwave technique for on-line measurement of moisture content in green lumber
M.M.Z. Kharadly, A.Y. Chan
Proposed microwave technique for on-line measurement of moisture content in green lumber M.M.Z. Kharadly and Amiee Y. Chan Department of Electrical Engineering, University of British Columbia 2356 Main Mall, Vancouver, C, Canada, V6T IZ4 B TEL. + 1 604 822-2816; FAX + 1 604822-5949 Abstract The paper presents a proposal for a microwave technique for the measurement of high moisture content in gre
0 document

ArtWhere Création de site Internet