RF INVESTIGATIONS ON HEMT's AT CRYOGENIC TEMPERATURES DOWN TO 20 K USING AN ON-WAFER MICROWAVE MEASUREMENT SETUP
H. Meschede, J. Albers, R. Reuter, J. Kraus, D. Peters, W. Brockerhoff, F.J. Tegude
RF INVESTIGATIONS ON HEMT's ON-WAFER
AT CRYOGENIC TEMPERATURES DOWN TO 20 K USING AN MICROWAVE MEASUREMENT SETUP
H. Meschede, 1. Albers, R. Reuter, 1. Kraus, D. Peters, W. Brockerhoff, F. 1. Tegude
ABSTRACT Microwave measurements at cryogenic temperatures are very important to investigate the pronounced microwave performance of High Electron Mobility Transistors (HEMT) /1,2/. In order to perfor