TRL CALIBRATION APPLIED TO THE MEASUREMENT OF CHIP TRANSISTOR S-PARAMETERS UP TO 40 GHz
Pradell L., Sabater C., Artal E., Comern A., Bará J., Corbella I., Fortuny J.
TRL CALIBRATION APPLIED TO THE MEASUREMENT S-PARAMETERS UP TO 40 GHz L. Pradell, ABSTRACT C. Sabater, E. Artal, A. Comer6n,
OF CHIP
TRANSISTOR
J. Bani, I. Corbella,
J. Fortuny.
(*)
The design of a Microstrip Test Fixture for TRL calibration, based on mobile, precisely positioned coax-to-microstrip transitions, is described. Experimental results for the measurement of GaAs FET and HEMT chips