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AN IMPROVED METHOD FOR MEASURING THE COMPLEX PERMITTIVITY OF LOSSY DIELECTRICS AT MILLIMETER-WAVE FREQUENCIES.
F. Bertolani, G. Falciasecca, V. Rizzoli
AN IMPROVED AT METHOD FOR MEASURING THE COMPLEX PERMITTIVITY OF LOSSY DIE- LECTRICS MILLIMETER-WAVE FREQUENCIES. Franco BERTOLANI (+). Gabriele FALCIASECCA (++) and Vittorio RIZZOLI (++). ABSTRACT An accurate rials applications. use above veloped new method eliminates knowledge Since of the complex at millimeter-wave method permittivity frequencies of dielectric for a number
ABOUT EXPERIMENTAL MEASUREMENTS OF DIELECTRIC ANISOTROPY OF LIQUID CRYSTALS FOR A WIDE FREQUENCY RANGE.
J.P. Parneix, C. Druon, A. Chapoton
ABOUT EXPERIMENTAL MEASUREMENTS OF DIELEC1RIC ANIS01ROPY OF LIQUID CRYSTALS FOR A WIDE FREQUENCY RANGE. J.P. PARNEIX, C. VRUON, A. CHAPOTON ABSTRACT Because are not of their price, some substances such as liquid crystals new available in large quantities. using In this paper, very small we present dielectric measurement techniques samples for a wide frequency range (from 1 Hz t
PRECISE DIELECTRIC MEASUREMENT TECHNIQUES FOR THE FREQUENCY RANGE 10 GHz TO 150 GHz
R.J. Cook, R.G. Jones
PRECISE DIELECTRIC TO 150 GHz MEASUREMENT TECHNIQUES FOR THE FREQUENCY RANGE 10 GHz COOK, R.J. and JONES, R.G. ABSTRACT Systems have been developed for the measurement of permittivity e' and loss angle for low and medium loss liquids and solids. Closed cavities constructed from helix waveguide have been used at 10 GHz and 35 GHz. Open resonators using one plane and one concave mirror in
SURFACE CHARACTERISTICS OF METALS AND WAVEGUIDE ATTENUATION AT MILLIMETERWAVE FREQUENCIES BETWEEN 25 and 180 GHz
F.J. Tischer
SURFACE WAVE CHARACTERISTICS BETWEEN OF METALS AND WAVEGUIDE ATTENUATION AT MILLIMETER25 and 180 GHz FREQUENCIES Frederick J. Tischer* ABSTRACT Discrepancies between theoretical and experimental values of the surface resistance of metals observed at millimeter wavelengths are analyzed. Experiments with carefully prepared plane and rough copper surfaces and precision measurements of waveguide
A FAST SAMPLING MICROWAVE FREQUENCY COUNTER
M. Sarhadi, C.S. Aitchison, M.J. Underhill
A FAST SAMPLING MICROWAVEFREQUENCY COUNTER M. Sarhadi*, C.S. Aitchison*, M.J. Underhill+ ABSTRACT A three-sampler frequency conversion technique is proposed for use in frequency counters. Its measurement range extends into the microwave frequency region without the long acquisition times associated with the conventional microwave translation techniques. An algorithm has been developed which c
APPLICATION OF GALVANOMAGNETIC DETECTORS BASED ON FERROMAGNETIC FILMS TO THE MEASUREMENTS OF MICROWAVE POWER FLOW IN UNMATCHED WAVEGUIDE
V.S. Vuntesmery
APPLICATION OF GALVANOMAGNETICDETECTORS BASED ON FERROMAGNETIC FILMS TO THE MEAStJREMENT OF MICROWAVE POWER FLOW IN UNMATCHEDWAVEGUIDE Val.S.VUNTESMERY ABSTRACT It has been shown theoretical and experimental, that unlike microwave power flow semiconductor transformers, the ferromagnetic film transformers operating in ferromagnetic resonance regime have to perform reactive discontinuity themselves
SAMPLING CATHODE-RAY TUBE DEVICE FOR MICROWAVE WAVEFORM ANALYSIS
F. Fujisawa, Y. Yamamoto, T. Ito, T. Iwai
SAMPLING CATHODE-RAY TUBE DEVICE FOR MICROWAVE WAVEFORM ANALYSIS Kazuo FUJISAWA, Yukio YAMAMOTO, Tetsuji ITO, Toru IWAI ABSTRACT This device is to visualize waveform analysis up to mm-waves. The operation is based on two distinctive principles. The first is the sampling of the waveform by a repeated electron beam pulse synchronous with it. The second is the usage of a negative feed back sy
LEVELED SUB-MICROWAVE SWEEP MEASUREMENTS WITH UNLEVELED SOURCES AND ONLY ONE DIODE
U. Unrau
LEVELED SOURCES Udo Unrau+ SUB-MICROWAVE SWEEP AND ONLY ONE DIODE MEASUREMENTS WITH UNLEVELED INDEXING TERMS: Millimeter waves, submillimeter waves, quasioptical waveguide, microwave measurements ABSTRACT: In the sub-microwave region it is quite impossible to obtain matched pairs of detectors and therefore to perform leveled sweep measurements. Besides large power variations available swee
APPLICATIONS OF IMPEDANCE TRANSFORMATION PROPERTY FOR ANALYSIS AND MEASUREMENTS OF MICROWAVE NETWORKS WITH VARIABLE ELEMENTS
T. Morawski, J. Modelski
APPLICATIONS OF IMPEDANCE TRANSFORMATION PROPERTY FOR ANALYSIS AND MEASUREMENTS OF ~ITCROWAVENETWORKS WITH VARIABLE ELEftmNTS Tadeusz Morawski, Jozef Modelski Abstract - This paper describes the methods of analysis and measurements of microwave networks employing variable elements without the knowledge of the equivalent circuits or elements of the network matrix. Described methods are the co
TIME-DOMAIN SPECTROMETRY OF HIGH FREQUENCY TRANSISTORS MEASURED UNDER TRANSIENT BIAS CONDITIONS
R.J. Hawkins
TIME-DOMAIN TRANSIENT SPECTROMETRY BIAS CONDITIONS OF HIGH FREQUENCY TRANSISTORS MEASURED UNDER R. J. Hawkins ABSTRACT Time-Domain Spectrometry has been used to measure S-parameters of high frequency power transistors, bipolar and MOS, under pulsed bias conditions to reduce the mean dissipation and hence the rise in temperature of the active device. decrease at high For the bipolar trans
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