EuMIC: DC and RF Characterization of Nano-Ridge HBT Technology Integrated on 300mm Si Substrates
S. Yadav, A. Vais, R.Y. ElKashlan, L. Witters, K. Vondkar, Y. Mols, A. Walke, H. Yu, R. Alcotte, M. Ingels, P. Wambacq, R. Langer, B. Kunert, N. Waldron, B. Parvais, N. Collaert
Proceedings of the 15th European Microwave Integrated Circuits Conference
DC and RF Characterization of Nano-ridge HBT
Technology Integrated on 300 mm Si Substrates
S. Yadav#, A. Vais#, R. Y. ElKashlan#*, L. Witters#, K. Vondkar#, Y. Mols#, A. Walke#, H. Yu#, R. Alcotte#¤,
M. Ingels#, P. Wambacq#*, R. Langer#, B. Kunert#, N. Waldron#, B. Parvais#*, and N. Collaert#
#
imec, Leuven, Belgium
VUB, B