Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band
Yibang Wang, Xingchang Fu, Aihua Wu, Chen Liu, Peng Luan, Faguo Liang, Wei Zhao, Xiaobang Shang
We present details of on-wafer-level 16-term error model calibration kits used for the characterization of W-band circuits based on a grounded coplanar waveguide (GCPW). These circuits were fabricated on a thin gallium arsenide (GaAs) substrate, and via holes, were utilized to ensure single mode propagation (i.e., eliminating the parallel-plate mode or surface mode). To ensure the accuracy of the