EuMIC: Evaluation of High-Voltage Transistor Reliability Under Nonlinear Dynamic Operation
Gianni Bosi, Antonio Raffo, Valeria Vadala, Francesco Trevisan, Gabriele Formicone, Jeff Burger, James Custer, Giorgio Vannini
Proceedings of the 12th European Microwave Integrated Circuits Conference
Evaluation of High-Voltage Transistor Reliability Under Nonlinear Dynamic Operation
Gianni Bosi#, Antonio Raffo#1, Valeria Vadalà#, Francesco Trevisan#, Gabriele Formicone*, Jeff Burger*, James Custer*, Giorgio Vannini#
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Department of Engineering, University of Ferrara via G. Saragat, 1, 44122, Ferrara, Italy
1antonio.raf