EuMIC: Nonlinear Charge Trapping Effects on Pulsed I/V Characteristics of GaN FETs
Alberto Santarelli, Rafael Cignani, Gian Piero Gibiino, Daniel Niessen, Pier Andrea Traverso, Corrado Florian, Claudio Lanzieri, Antonio Nanni, Dominique Schreurs, Fabio Filicori
Proceedings of the 8th European Microwave Integrated Circuits Conference
Nonlinear Charge Trapping Effects on Pulsed I/V Characteristics of GaN FETs
Alberto Santarelli1, Rafael Cignani1, Gian Piero Gibiino1,2, Daniel Niessen1, Pier Andrea Traverso1, Corrado Florian1, Claudio Lanzieri3, Antonio Nanni3, Dominique Schreurs2, Fabio Filicori1
1
DEI "Guglielmo Marconi", University of Bologna, Viale Ri