EuMIC: Capacitance RF Characterization and Modeling of 28FD-SOI CMOS Transistors Down to Cryogenic Temperature
Q. Berlingard, Jose Lugo-Alvarez, M. Bawedin, T. Mota-Frutuoso, C. Durand, D. Gloria, P. Galy, M. Casse
Proceedings of the 18th European Microwave Integrated Circuits Conference
Capacitance RF Characterization and Modeling of 28
FD-SOI CMOS Transistors down to Cryogenic
Temperature
Q. Berlingard#*, J. Lugo-Alvarez#, M. Bawedin*, T. Mota-Frutuoso#, C. Durand§, D. Gloria§, P. Galy§, M. Cassé#
#
CEA-Leti, Univ. Grenoble Alpes, France
Univ. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, Grenoble INP,