EuMIC: New Qualified Industrial AlGaN/GaN HEMT Process: Power Performances & Reliability Figures of Merit
D. Floriot, Herve Blanck, Diane Bouw, F. Bourgeois, Marc Camiade, Laurent Favede, Michael Hosch, H. Jung, B. Lambert, A. Nguyen, K. Riepe, J. Splettstosse, Hermann Stieglauer, James Thorpe, U. Meiners
Proceedings of the 7th European Microwave Integrated Circuits Conference
New Qualified Industrial AlGaN/GaN HEMT Process: Power Performances & Reliability Figures of Merit
D. Floriot2, H. Blanck1 , D. Bouw 2, F. Bourgeois1, M. Camiade2, L. Favède2, M. Hosch1, H. Jung1, B. Lambert2, A. Nguyen2, K. Riepe1, J. Splettstöße1, H. Stieglauer1, J. Thorpe1, and U. Meiners1
2
United Monolithic Semiconduct