On the evaluation of the high-frequency load line in active devices
Antonio Raffo, Gustavo Avolio, Dominique M.M.-P. Schreurs, Sergio Di Falco, Valeria Vadalŕ, Francesco Scappaviva, Giovanni Crupi, Bart Nauwelaers, Giorgio Vannini
In this work a de-embedding technique oriented to the evaluation of the load line at the intrinsic resistive core of microwave FET devices is presented. The approach combines vector high-frequency nonlinear load-pull measurements with an accurate description of the reactive nonlinearities, thus allowing one to determine the actual load line of the drain?source current generator under realistic con