EuMIC: Improved Microwave Noise and Linearity Performance in GaN MISHEMTs on Silicon with ALD Al_2O_3 as Gate Dielectric
Z.H. Liu, G.I. Ng, S. Arulkumaran, Y.K.T. Maung, K.L. Teo, S.C. Foo, S. Vicknesh
Proceedings of the 5th European Microwave Integrated Circuits Conference
Improved Microwave Noise and Linearity Performance in GaN MISHEMTs on Silicon with ALD Al2O3 as Gate Dielectric
Z. H. Liu1,2, G. I. Ng1,2, S. Arulkumaran2, Y. K. T. Maung2, K. L. Teo2, S. C. Foo2, and S. Vicknesh2
1
School of Electrical and Electronics Engineering, Nanyang Technological University, Singapore +65-81831893
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