EuMIC: Analysis of Fin Width and Temperature Dependence of Flicker Noise for Bulk-FinFET
T. Ohguro, K. Okano, T. Izumida, S. Inaba, N. Momo, K. Kokubun, H.S. Momose, Y. Toyoshima
Proceedings of the 4th European Microwave Integrated Circuits Conference
Analysis of Fin width and temperature dependence of flicker noise for bulk-FinFET
T. Ohguro, K. Okano, T. Izumida, S. Inaba, N. Momo, K. Kokubun, H. S. Momose, and Y. Toyoshima
Center for Semiconductor R&D, Semiconductor Company, Toshiba Corporation 8, Shinsugita-cho, Isogo-ku, Yokohama, Japan
tatsuya.ooguro-toshiba.co.jp Ab