New Trends in Characterization and Modeling of High Power Devices
P. Bouysse, D. Barataud, R. Sommet, J. P. Teyssier, J. M. Nébus, R. Quéré
New Trends in Characterization and Modeling of High Power Devices
Ph. Bouysse, D. Barataud*, R. Sommet, J.P. Teyssier, J.M. Nébus*, R. Quéré
IRCOM, CNRS, Université de Limoges, IUT GEII, 7 rue Jules Vallès, 19100 Brive, France * IRCOM, CNRS, Université de Limoges, 123 av. Albert Thomas, 87060 Limoges, France Abstract In this paper, we present some non exhaustive measurement techniques used for ch