S-parameter uncertainty computations J.Vidkjaer Electromognetics Institute, Tech. Univ.of Denmark,DTHbldg.348, DK2800 Lyngby, Denmark,Tel+45 42 881444; Fox+45 931634; e-moiljv-sysmns.emi.dthdk Abstract A method for computing uncertainties of measured sparameters is presented. Unlike the specification software provided with network analyzers, the new method is capable of calculating the uncertai

Comparison of thick- and thin-film technology using wafer probes J Rodriguez Tellez Deportment of Electronic & Electrical Engineering University of Bradford, BRADFORD, West Yorkshire, BD7 1DP, UK TEL.: +44274384008; FAX: +44274391521 Abstract In this paper, a newly-designed thick-film low-cost probe for onwafer S-parameter measurements is described and compared with a thin-film version. Test resu

Characterization of lossy transmission lines of arbitrary characteristic impedance by time domain measurements P. Ferrari, B. Flechet, G. Angenieux lAHC, Universitede Savoie, 73376 Tel.: 79-75-87-51 Fax.: 79-75-87-42 Le Bourget du Lac, France. Abstract This paper deals with the characterization of lossy transmission lines, The method developed here delivers the complex propagation coefficient y a

Comparison of on-wafer calibrations using the concept of reference impedance Francese Purroy, Lluis Pradell Universitat Politecnica de Catalunya, Department of signal theory and communications, ETSE Telecomunicaci6. Ap. 30002 - 08080 Barcelona. Spain Abstract A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedan

Automatic control of constant highly reflective loads in active load-pull systems for the characterization of compression eHects and 1M3 in SSPAs J.M. Coupat - F. Blanche - Y.Narbonne J.M. Nebus Ph. Bouysse - J.P. Villotte IRCOM - Faculte des Sciences - URACNRS n° 356 123, Avenue Albert-Thomas 87060 LIMOGES C8dex Abstract Optimization of trade-offs between power added efficiency and third order in

Impact of probe array-test antenna interaction on the accuracy of near-field techniques in spherical coordinates A. Ziyyat, D. Picard, J.Ch. Bolomey 91192 Electromagnetics Department, Gif-sur-Yvette Cedex, SUPELEC Plateau de Moulon, France. Abstract The use of probe arrays has demonstrated its efficiency to provide accurate and rapid near-field measurements. The interaction between the probe arra

Wafer probing at W-band Edward M. Godshalk Cascade MicrotechInc., Beavenon,Oregon, USA. Abstract A W-band (75-110 GHz) wafer probe is presented. The probe uses ridge-trough waveguide to transition from a rectangular waveguide input to coplanar waveguide used on the probe board output. Research was conducted on radiation loss and moding in coplanar waveguide to minimize insertion loss and maintai

HTSC current controlled devices for microwave applications S.A. Gal'chenko**, D.I. Kaparkov*, v.v. Kuz:netsov*, M. Lofgren *, V.M. Pchelkin**, A.W. Shchepak**, I.B. Vendik** * Dept. Microwave Technology, Chalmers Universityof Technology, S-4 1296 G6teborg, Sweden. Fax +46-31 ] 64513. * * ] 97376, Russia. Fax +7812 234 99 83. St. Petersburg Electrotechnical University, St. Petersburg, Abstract T

Non-reflective low-noise modulator: The beneficial application of HTSCat microwaves v.v. Ku:znetsov*, D.I. Kaparkov*, M. Lofgren *, I.B. Vendiku * Dept. Microwave Technology, Chalmers Universityof Technology, 5-41296 Gbteborg, Sweden Fax +46-31 164513. * * 51. Petersburg Electrotechnical University, 51. Petersburg, 197376, Russia.Fax+7-812 23499 83. Abstract A high effective non-reflective HTSC

GaAs MMIC wide-band Jose I. Alonso. I Ernesto J. Lopez. I Felix Perez. I Felix Ortigoso+ I Angel Boveda+ 4-way phase spliffer *E.T.S.I.Telecomunicaci6n.UniversidadPolitecnicade Madrid. Spain + Alcatel Standard Electrica, SA Abstract A MMIC 4-way phase splitter has been designedwith phase and amplitude errors less than 2° and 0.5 dB respectively over the 0.7+3 Ghz band. The circuit consists of