EuMIC: Investigation of Thermal Resistance Extraction of GaN HEMTs Through DCT Measurements Techniques and TCAD-Based Physical Simulations
M. Bouslama, J.C. Jacquet, F. Gaillard, S. Piotrowicz, R. Sommet, J.C. Nallatamby, G. Gauthier
Proceedings of the 19th European Microwave Integrated Circuits Conference
Investigation of Thermal Resistance Extraction of
GaN HEMTs through DCT Measurements
Techniques and TCAD-Based Physical Simulations
M.Bouslama#, J.C.Jacquet#, F.Gaillard*, S.Piotrowicz#, R.Sommet*, J.C.Nallatamby*, G.Gauthier#
#
III-V Lab, France
Xlim laboratory, France
mohamed.bouslama-3-5lab.fr
*
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