NEw MICROWAVE SYSTEM TO DETERMINE THE COMPLEX PERMITTIVITY OF SMALL DIELECTRIC AND SEMICONDUCTING SAMPLES
Musil J., Zåcek F., Bürger A., Karlovský J.
NEIl MICROW'AVE SYSTE.'M TO DETEHMINE OF SMALL DIELECTRIC
THE CO:t-1PLEX PER}1ITTIVITY SAMPLES
AND SEJ.fICONDUCTING
J. l-1usil x, F. ~;icCkx, A. BUrger +, J. Kar lovsky + Abstraot:
This dielectric ler than permittivity measure electric are rowaves, system of the tained by paper describes the of very for materials. way than the slab new small microwave transverse This the the samples material of