Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-wave applications: proposal of reliability-aware circuit design methodology
Insaf Lahbib, Sidina Wane, Aziz Doukkali, Dominique Lesénéchal, Thanh Vinh Dinh, Laurent Leyssenne, Rosine Coq Germanicus, Françoise Bezerra, Guy Rolland, Cristian Andrei, Guy Imbert, Patrick Martin, Philippe Descamps, Guillaume Boguszewski, Damienne Bajon
In this contribution, the impact of extreme environmental conditions in terms of energy-level radiation of protons on silicon?germanium (SiGe)-integrated circuits is experimentally studied. Canonical representative structures including linear (passive interconnects/antennas) and non-linear (low-noise amplifiers) are used as carriers for assessing the impact of aggressive stress conditions on their