EuMIC: Evaluation of GaN FET Power Performance Reduction Due to Nonlinear Charge Trapping Effects
Alberto Santarelli, Rafael Cignani, Daniel Niessen, Gian Piero Gibiino, Pier Andrea Traverso, Valeria Di Giacomo, Christophe Chang, D. Floriot, Dominique Schreurs, Fabio Filicori
Proceedings of the 9th European Microwave Integrated Circuits Conference
Evaluation of GaN FET Power Performance Reduction Due to Nonlinear Charge Trapping Effects
Alberto Santarelli1, Rafael Cignani1, Daniel Niessen1, Gian Piero Gibiino1,2, Pier Andrea Traverso1, Valeria Di Giacomo3, Christophe Chang3, Didier Floriot3, Dominique Schreurs2, Fabio Filicori1
DEI "Guglielmo Marconi", University of B