EuMIC: Ruggedness and Reliability of GaN HEMT
Fumikazu Yamaki, Kazutaka Inoue, Masahiro Nishi, Hitoshi Haematsu, Norihiko Ui, Kaname Ebihara, Atsushi Nitta, Seigo Sano
Proceedings of the 6th European Microwave Integrated Circuits Conference
Ruggedness and Reliability of GaN HEMT
Fumikazu Yamaki1, Kazutaka Inoue1, Masahiro Nishi2, Hitoshi Haematsu2, Norihiko Ui2, Kaname Ebihara2, Atsushi Nitta2 and Seigo Sano1
Transmission Devices R&D Laboratories, Sumitomo Electric Industries, Ltd. 2 Sumitomo Electric Device Innovations Inc. 1000 Kamisukiawara, Showa-cho, Nakak