EuMIC: Temperature Dependent Degradation Modes in AlGaN/GaN HEMTs
Y. Douvry, V. Hoel, J.C. De Jaeger, N. Defrance, C. Sury, N. Malbert, N. Labat, A. Curutchet, C. Dua, M. Oualli, M. Piazza, J.-M. Bluet, W. Chikhaoui, C. Bru-Chevallier
Proceedings of the 5th European Microwave Integrated Circuits Conference
Temperature dependent degradation modes in AlGaN/GaN HEMTs
Y. Douvry1, V. Hoel1, J.-C. De Jaeger1, N. Defrance1, C. Sury2, N. Malbert2, N.Labat2, A. Curutchet2, C. Dua3, M. Oualli3, M. Piazza3, J.-M. Bluet4 , W. Chikhaoui4, C. Bru-Chevallier4
1
IEMN (Institut d'Electronique, de Microélectronique et de Nanotechnologie), UMR