GAAS: Noise Assessment of AlGaN/GaN HEMTs on Si or SiC Substrates: Application to X-Band Low Noise Amplifiers
J.C. De Jaeger, S.L. Delage, G. Dambrine, M.A. Di Forte Poisson, V. Hoel, S. Lepilliet, B. Grimbert, E. Morvan, Yves Mancuso, G. Gauthier, A. Lefrancois, Y. Cordier
Noise Assessment of AlGaN/GaN HEMTs on Si or SiC Substrates: Application to X-band Low Noise Amplifiers
J.C. De Jaeger1, S. L. Delage2, G. Dambrine1, M.A Di Forte Poisson2, V. Hoel1, S. Lepilliet1, B. Grimbert1, E. Morvan1,Y. Mancuso3, G. Gauthier3, A. Lefrançois3, Y. Cordier4
1
TIGER/IEMN Lille University, Ave. Poincaré, F-59652, Villeneuve d'Ascq, FRANCE, (33) 3 20 19 78 34
2 3
TIGER/TRT-F, Do